Salary
💰 $90,000 - $173,000 per year
About the role
- Senior FPGA / Digital Design Engineer to develop high speed digital circuit designs and FPGAs for flight control and weapons bay actuators for next generation aircraft
- Moog is a leader in doing military aerospace work and provides FCAS systems for aircraft like the F-35 Lightning II and the V280 Valor
- You will contribute to the development of new electronic product requirements through consulting with our customers and system engineers
- Perform trade studies and analyses to validate conceptual designs
- Perform high speed digital circuit design including schematic capture and specifying printed circuit board design requirements (placement constraints, trace parameters, and routing layer constraints).
- Develop firmware for FPGAs that work with electronics, sensors, electro-hydraulic actuators, electromechanical components, and communication links for actuation systems or avionics equipment
- Conduct prototype testing, integration testing, and design verification and validation testing
- Document design, analysis, and verification results with accurate and concise reports
- Provide formal technical presentations to internal and external customers to support program review and business development
- Specify and support design of lab test setups
Requirements
- Bachelor’s Degree in Electrical Engineering
- 7+ years of professional work experience in design and development engineering
- 5+ years of digital design expertise including modern microprocessors / DSPs, high speed digital logic, FPGA, memory, analog-to-digital, digital-to-analog converters, and communication links
- Knowledge of board design and layout including design tools
- 5+ years of experience with VHDL or Verilog coding
- Experience designing test benches and simulations using digital simulation tools (example Questa, Active-HDL) for verification of FPGA designs
- Analysis expertise including power dissipation, power use, timing, signal integrity, component derating, and Acceptance Test / Built-In Test coverage